Bruel And Kjaer Helps To Test Lift Sound Quality

Orona has used Bruel and Kjaer's Head and Torso Simulator (HATS), binaural microphones and Pulse sound-quality software to analyse the sound-quality behaviour of its lifts. This equipment allowed it to correlate the sound quality with the different noise sources and to study the most appropriate ways to improve lift comfort. Orona (manufacturer of lifts), Mondragon Goi Eskola Politeknikoa (MGEP [Engineering Faculty of Mondragon University]) and Ikerlan (Research Centre) formed a consortium to investigate the sound quality in Orona's lifts.

According to Unai Galfarsoro, the coordinator of the acoustic and vibration group at Mondragon University: 'The reason for establishing the sound-quality project is the need to go beyond the traditional A-weighted sound pressure level, which is usually used to rank different noise sources, because we believe that a complete sound-quality analysis gives wider and more reliable results. 'The objective is to analyse the actual sound-quality performance of the various types of Orona lifts, to correlate the sound quality with the different noise sources and to study the most suitable approaches to improve the comfort of the lifts,' he added.

Before carrying out the sound-quality process, the types of lifts to be analysed were selected and six of each type were tested. Three up and three down full travelling cycles (doors closing, acceleration, constant speed, deceleration and doors opening) were measured from the bottom to the top floor and back and the time data was the basis for the following sound-quality analysis.

The equipment used consisted of Bruel and Kjaer's Sound Quality Head and Torso Simulator (HATS) Type 4100-D, equipped with two microphones for binaural noise measurements. The two signals were recorded using a Pulse IDAe front-end and time data recorder software. 'The Pulse front-end is useful for measurements inside a moving lift as it makes no noise at all (its fan can be switched off during measurements) and it can be battery operated. 'Besides, time data recorder software is extremely simple to configure and use for time data measurements,' added Galfarsoro.

Kelvin Test Socket Provides Minimal Signal Loss

Aries Electronics is offering a Kelvin test socket that handles devices with a lead pitch down to 0.4mm. The socket uses two independent Aries Kelvin spring probes per device pad for reliable, low-resistance testing of MLF, QFN, LGA and other leadless devices. With a signal path of only 0.082in, Aries' Kelvin test socket is said to provide minimal signal loss for higher bandwidth capability.

The socket's low-cost, two-piece construction and small overall size allows the maximum number of sockets per test board. The operator-friendly, low-profile socket uses solderless pressure mount compression spring probes, accurately located by two moulded plastic alignment pins and mounted with four stainless-steel screws, allowing for easy mounting and removal from the test board.

For increased reliability, the gold-over-nickel-plated probes leave small witness marks on the bottom of the device pads. The probes are constructed of heat-treated beryllium-copper with a minimum of 50 micron inches (1.27 micron mm) gold per Mil-G-45204 over 50 micron (1.27 micron mm) nickel per SAE-AMS-QQ-N-290.

The pressure pad compression spring provides proper force against the device and allows for height variations in device thickness. A probe blade edge tip ensures cutting through solder oxides layers for use in applications with RoHS-coated or gold pads. Contact forces are 16G per contact on a 0.40mm to 0.45mm pitch.

The probe can operate in temperatures from -55C to 150C and contact life is an estimated minimum of 500,000 cycles. The machined socket components are UL 94V-0 Peek or Torlon, screws and alignment pins are stainless steel, and moulded socket components are UL 94V-0 Ultem. The Kelvin test socket contact system is available for any Aries CSP test socket. As with all Aries sockets, the Kelvin test socket is available in custom materials, platings, sizes and configurations to suit specific applications.

Test Set Gets Bluetooth Low-Energy Testing Option

Anritsu has introduced a Bluetooth low-energy testing option that allows designers and manufacturers of Bluetooth products to conduct radio layer testing in compliance with Core Specification 4.0. With this option, engineers can use the MT8852B to complete a test script covering Bluetooth basic rate, enhanced data rate and low-energy measurements in <15 seconds by pressing a single key. The Bluetooth low-energy measurement option adds six low-energy test cases to the base MT8852B test set.

These test cases can be run as part of a test script to simplify creation of test programs and reduce test times. Bluetooth low-energy measurements are performed directly on the MT8852B, which controls the DUT using defined HCI or two-wire control commands. For development applications, the MT8852B low-energy measurement option is supplied with a PC application that displays low-energy reference test packets in graphical format, as well as providing clear pass/fail status for all supported measurements against the specified limits.

This facilitates the identification of the causes of any device failure during the critical design and development stages. Bluetooth low energy is ideal for applications that require occasional data transfer from devices that run for over a year from a single-button cell battery. Typical applications include sports and fitness devices such as heart-rate monitors, as well as medical products such as blood glucose meters and industrial sensors.

Agilent Selected As HDMI Test Solution Provider

Simplay Labs, which operates four of the eight HDMI Authorized Test Centers (ATCs), has selected Agilent Technologies as its high-definition multimedia interface (HDMI) test solution provider. Agilent's test solution meets, or exceeds, the requirements of the HDMI Compliance Test Specification (CTS) Version 1.4 and is listed as recommended test equipment. The Agilent test solution addresses four sectors: source testing, sink testing, media physical layer evaluation and protocol test.

The test solution was designed to reduce development costs while providing accurate test results with greater flexibility. Agilent's HDMI solution offers full automation software, which speeds up testing, providing efficient electrical performance of the devices and fast test throughput, which increases productivity; and the HEAC (HDMI Ethernet and Audio Return Channel) sink test setup, which is independent of the TMDS signal generator, often heavily used for high-speed electrical sink testing.

Agilent has been involved with the HDMI specification since the standard was first established to help companies meet compliance testing and address the challenges presented by this technology. Agilent has developed tools in the physical, data link and protocol layers to meet the challenges posed by the standard. They are designed to reduce development costs, provide accurate test results and simplify the measurement processes for test engineers in the consumer electronics, cable manufacturer and semiconductor industries. ATCs are using Agilent's HDMI platform to test products, identify problems, measure data and determine whether tests have passed or failed.

Agilent's modular HDMI test platform is said to help customers improve the quality of their consumer electronics products and meet the demand of this rapidly advancing market. 'Upgrading our US, Korean and two China facilities will enable us to serve our customers with all HDMI Specification Version 1.4 test services,' said Joseph Lias, president of Simplay Labs. 'Continuing to work with Agilent and its partner Bitifeye Digital Test Solutions ensures that our customers' products can be effectively tested in our ATCs for HDMI 1.4 features such as 3D over HDMI, 4K video format, content type and the new colour spaces,' he added.

The Agilent HDMI 1.4 complete test platform includes: modular HEAC test upgrade using Agilent's 81150A pattern generator platform and Infiniium oscilloscopes; single high-speed N5998A audio/video timing and video picture analyser recommended in the CTS Version 1.4; TMDS electrical test coverage with a single E4887A TMDS signal generator, which covers all high-speed digital tests; and test automation with broadest test coverage using the N5990A software controlling TMDS signal generator, the N5998A, an oscilloscope and complementary Quantum Data 882EA (for EDID, CEC and HDCP test).

It also includes: Infiniium 90000A Series oscilloscopes with N5399A compliance test software; Parbert 81250-based E4887A TMDS signal generator; N5998A protocol/audio/video generator and analyser; N5990A test automation software platform from Bitifeye; E5071C network analyser; and N1080A Type A test-point access fixtures.

Amplicon Customises Test-System Hardware

Amplicon's Test Systems Division provides system integrators and end-users with the widest range of test-system hardware at a competitive price. PXI, compact PCI (cPCI), LXI and PC-based systems, along with an extensive product-integration service, provide customers with a finished hardware platform that allows them to concentrate on their specific area of expertise - typically the addition of a bespoke test software application.

John Hayward, product manager for Amplicon's Test Systems Division, said: 'In a recent application, Amplicon's PC-based test system provided a saving of over GBP100,000 compared with in-house development, at a major oil and gas instrumentation specialist.' In the current trend of out-sourcing non-critical functions, many companies have reduced knowledge and manpower for implementing new test systems and upgrading existing lines.

Factors that must be considered when designing a suitable test-system solution include: power calculations for PC power supply and UPS specifications; selection of appropriate signal conditioning for connection to the myriad sensors and transducers in the market; data-transfer limitations of system buses such as PCI and VXI; and advanced triggering and synchronisation for time-dependent measurements.

Seaward Unveils High-Voltage Test Range

Seaward Electronic has announced a range of high-voltage test equipment. The range is designed for the safe and practical detection of voltages on electrical systems in the power generation and distribution, rail network, petrochemical, and electrical service and maintenance industries. The high-voltage safety testing equipment available includes neon and digital voltage indicators, safe discharge units, neon and digital phasing equipment, insulator leakage detectors and current clamps.

The KDIE high-voltage indicators include neon and digital systems to confirm the presence of voltage on earthed neutral electrical circuits up to 33kV. These are supported by a range of high-voltage phasing rods that enable phase comparisons to be made at the point of paralleling two circuits, without the interposition of voltage transformers or secondary wiring circuits. A neon-type instrument is available for use on circuits up to 11.5kV, and digital versions are available for use on systems of up to 15kV and 33kV.

The range of HV indicators and phasing units is supported by a hook ammeter for accurately measuring current flow on overhead power lines, and a large jaw clamp meter for the measurement of current flow through large conductors. In addition to the standard range of test equipment, specialist testers are available for the safe discharge of stored energy in large capacitors and electrically charged equipment. A dedicated airfield ground lighting voltage detector has also been introduced, for proving dead-on AGL systems up to 5kV.

All high-voltage test and measurement equipment in the Seaward range complies with international safety standards and is manufactured in accordance with IEC 61243. As well as specialist carrying cases, a range of accessories is available in support of the main high-voltage test instruments. These comprise proving units, battery chargers, overhead line extensions and bend-end adaptors for specialist switchgear locations.

Megger Unveils Protection Relay Test Set

Megger has introduced the Freja 306 protection relay test set. It provides an economical system for testing protection relays, including differential types, and has six independently controlled current outputs. The Freja 306 features extended Hi-Current outputs, rugged construction and a wide operating temperature range, making it ideal for field use.

It is suitable for use as a stand-alone device, or in conjunction with a PC running the Freja WIN software package. In either case, the operation of the instrument is straightforward and intuitive, with Freja WIN adding the benefits of a highly intuitive graphical user interface, as well as enhanced options for automated testing. The outputs of the Freja 306 can be configured as 3 x 15A plus 3 x 35A, or as 1 x 100A.

The outputs with a 35A rating are particularly useful when testing 5A relays, while the capability of these outputs of generating up to 50V eases the testing of many types of electromechanical relay. The Freja 306 also provides low-level analogue inputs, designed for transducer measurements, and high-level inputs for normal voltage and current measurements.

Static and dynamic tests can be performed with the instrument including, for example, pre-fault and fault generation, simultaneous ramping of multiple quantities and waveform editing. The Freja 306 can also be used, in conjunction with Freja SIM software, as a disturbance simulator with the capability of importing recorded disturbances.

It complements the Freja 300 protective relay test set, which will continue to be available. Users of Freja 300 instruments can upgrade them to the full Freja 306 specification simply by adding an auxiliary CA30 amplifier module that attaches easily and neatly to the bottom of the instrument.